Title :
Initiation mechanism of pulsed surface flashover along silicon in vacuum by pre-breakdown conduction and photon emission
Author :
Nam, S.H. ; Sudarshan, T.S.
Author_Institution :
University of South Carolina
Keywords :
Breakdown voltage; Electric breakdown; Flashover; Gold; Leakage current; Photoconducting materials; Silicon; Switches; Testing; Vacuum breakdown;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767498