Title :
Radiation effects in analog CMOS analog-to-digital converters
Author :
Turflinger, Thomas L. ; Davey, Martin V. ; Bings, John P.
Author_Institution :
Div. Crane, Naval Surface Warfare Center, Crane, IN, USA
Abstract :
Analog CMOS circuitry is becoming common in the marketplace. Two commercial ADC are tested in the total dose and dose rate environments. Test results and applicability to system use are discussed
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; gamma-ray effects; analog CMOS circuitry; analog-to-digital converter; dose rate; radiation effect; total dose; CMOS technology; Circuit testing; Clocks; Degradation; Frequency; MOS capacitors; Radiation effects; Resistors; Switched capacitor circuits; Switching converters;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574182
