Dynamic measurement system of thermoelectric module parameters

A simple and easy-to-use device for measuring thermoelectric module (TEM) properties is presented. The characterization system provides continuous direct measurement of TEM hot and cold side temperatures, electric current flow, and terminal voltage. Seebeck voltage is measured using the Harman method. These measurements are then used to obtain dynamic values of TEM fundamental parameters: electrical resistance, thermal conductance and Seebeck coefficient, from which the TEM figure-of-merit can be calculated. Test conditions, i.e., current flowing through the module can be varied by the user. The thermal circuit used by the characterization system includes an auxiliary TEM that enables to emulate a controlled ambient temperature, which increments the repeatability and versatility of each test. Additionally, the dynamic response can be varied by interchanging the thermal load. Repeatability tests show a dispersion between direct measurements of less than 50mK for temperature measurements and less than 4mV for voltage measurements.