DocumentCode
283468
Title
IEE Colloquium on `Computer Aided Test and Diagnosis´ (Digest No.100)
fYear
1988
fDate
32419
Abstract
The following topics were dealt with: functional testing; testability; expert systems; fault testing; integrated tools. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords
automatic test equipment; automatic testing; integrated circuit testing; printed circuit testing; expert systems; fault testing; functional testing; integrated tools; testability;
fLanguage
English
Publisher
iet
Conference_Titel
Computer Aided Test and Diagnosis, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
209471
Link To Document