DocumentCode :
2834839
Title :
Architecture design and technical methodology for bus testing
Author :
Haghbayan, M.H. ; Navabi, Z.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear :
2010
fDate :
17-20 Sept. 2010
Firstpage :
504
Lastpage :
509
Abstract :
In this paper we present an architecture and corresponding algorithm for bus testing in the System on Chip (SoC) design. In our test methodology we used hierarchical functional testing to test all available components in a bus except cores of the SoC as fast as possible. According to our proposed method, first small components and wires are tested and then, higher level operations of the bus (like burst transfers) will be tested. For each step of bus testing, an architecture is proposed. We show the efficiency of our proposed method using a real SoC as experimental result.
Keywords :
logic testing; system-on-chip; bus testing; hierarchical functional testing; system on chip design; Logic gates; Multiplexing; Random access memory; Solids; System-on-a-chip; Testing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-9555-9
Type :
conf
DOI :
10.1109/EWDTS.2010.5742078
Filename :
5742078
Link To Document :
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