Title :
IEE Colloquium on `Techniques for Testing and Measuring Digital Systems´ (Digest No.105)
Abstract :
The following topics were dealt with: logic analysers; digital in-circuit testing; probabilistic fault diagnosis; low-cost ATE; opto-isolator interface circuit designed for testability; and automatic testing for analogue and digital mixed environments. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords :
automatic test equipment; automatic testing; computer interfaces; digital instrumentation; electronic equipment testing; integrated circuit testing; logic analysers; logic testing; automatic testing; digital in-circuit testing; logic analysers; low-cost ATE; opto-isolator interface circuit; probabilistic fault diagnosis; testability;
Conference_Titel :
Techniques for Testing and Measuring Digital Systems, IEE Colloquium on
Conference_Location :
London
