A smart measurement system for reconstructing voltage rms value over long time interval

Determining the trend over long time interval of parameters characterizing electrical power systems usually requires high storage capacity. The authors have proposed a measurement technique, based on both a random sampling strategy and a statistical approach, which allows to reconstruct the trend of a given parameter by processing a very limited amount of data. In this paper, a smart system implementing such a technique is presented. It is a microcontroller-based device devoted to the acquisition of the rms values on low voltage systems. The results of some experimental tests showing the good performance of the implemented device are also presented and discussed.