Title :
Microwave waveguide-grating dielectric filters
Author :
Tibuleac, S. ; Magnusson, R. ; Maldonado, T.A.
Author_Institution :
Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
Abstract :
Studies of resonance anomalies in waveguide gratings have demonstrated unique filtering capabilities of such structures. This new type of optical filter combines the principles of diffraction by periodic structures with waveguide theory and antireflection thin-film properties to yield filters with 100% reflectance at a desired wavelength. By appropriate choice of the multilayer waveguide-grating parameters, one can design narrowband or broadband reflection filters with arbitrarily low, symmetric sidebands extended over a large frequency range. Multilayer structures yielding high reflection off resonance can be used to design high efficiency transmission bandpass filters with similar features. The paper illustrates the characteristics of reflection and transmission bandpass filters in the microwave spectral region. Owing to the larger sizes of the gratings and the availability of materials with larger dielectric constants, there is increased flexibility in the design of microwave filters as compared to their optical counterparts.
Keywords :
band-pass filters; dielectric devices; diffraction gratings; microwave filters; optical waveguide filters; antireflection thin-film properties; broadband reflection filters; dielectric constant; diffraction; microwave spectral region; microwave waveguide-grating dielectric filters; multilayer waveguide-grating parameters; narrowband reflection filters; optical filter; periodic structures; reflectance; reflection bandpass filters; resonance anomalies; symmetric sidebands; transmission bandpass filters; waveguide theory; Band pass filters; Dielectrics; Gratings; Microwave filters; Nonhomogeneous media; Optical filters; Optical reflection; Optical waveguide theory; Optical waveguides; Resonance;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-3216-4
DOI :
10.1109/APS.1996.549821