Title :
A probabilistic diagnostic model in malicious environments and its algorithms
Author :
Jian-Jun, Liu ; Ben-Wei, Rong
Author_Institution :
Beijing Inst. of Data Process. Technol., China
Abstract :
Presents a new model, noted as (p,m)-diagnosable, which can probabilistically model malicious environments in a uniform manner. A heuristic-inference algorithm, an approximate diagnosability algorithm and two characterization theorems of (p,m)-diagnosable systems are given. The complexity of (p,m)-diagnosability is examined to be co-NP-complete. An example (p,m)-diagnosable system is given
Keywords :
computational complexity; fault tolerant computing; (p,m)-diagnosable systems; approximate diagnosability algorithm; characterization theorems; complexity; fault tolerance; heuristic-inference algorithm; malicious environments; probabilistic diagnostic model; Algorithm design and analysis; Data processing; Equations; Heuristic algorithms; Testing;
Conference_Titel :
Fault Tolerant Systems, 1991. Proceedings., Pacific Rim International Symposium on
Conference_Location :
Kawasaki
Print_ISBN :
0-8186-2275-X
DOI :
10.1109/{RFTS.1991.212952