Title :
Measurement and analysis of physical defects for dynamic supply current testing
Author :
Thomas, Scott ; Makki, Rafic ; Vavilala, Sai Kishore
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
We present an iDDT fault analysis study based on physical measurements of circuits with built-in defects. A variety of defects were inserted into basic circuit components. The measured results were utilized to better model the effect of defects on iDDT and improve simulated fault models.
Keywords :
built-in self test; circuit simulation; electric current measurement; fault diagnosis; integrated circuit testing; invertors; basic circuit components; built-in defects; dynamic supply current testing; fault models; iDDT fault analysis; invertors; physical defects analysis; physical defects measurement; Circuit simulation; Circuit testing; Conferences; Current measurement; Current supplies; Electronic equipment testing; Inverters; Layout; MOSFETs; Pulse measurements;
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
DOI :
10.1109/DELTA.2004.10031
