Title :
Detection and Measurement of Thin Dielectric Layers Using Reflection of Frequency Scanned Millimetric Waves
Author :
Bowring, Nicholas J. ; Baker, John G. ; Alder, John F.
Author_Institution :
Manchester Metropolitan Univ., Manchester
Abstract :
A method is described for detection and measurement of thin concealed dielectric layers using frequency scanned millimetre wave reflectometry, and carrying out a Burg or Fourier transformation of the results. Three dimensional data may potentially be obtained by moving the beam over the surface of the sample. Multiple layers of thickness ranging from 10 mm to 100 mm are readily detected and monitored through their microwave optical properties.
Keywords :
Fourier transforms; dielectric thin films; microwave photonics; microwave reflectometry; millimetre wave detectors; millimetre wave measurement; thickness measurement; Burg transformation; Fourier transformation; frequency scanned millimetric wave reflectometry; microwave optical properties; size 10 mm to 100 mm; thin concealed dielectric layers; Dielectric measurements; Frequency measurement; Lenses; Optical harmonic generation; Optical interferometry; Optical receivers; Optical reflection; Optical surface waves; Optical transmitters; Thickness measurement;
Conference_Titel :
Networking, Sensing and Control, 2007 IEEE International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1076-2
Electronic_ISBN :
1-4244-1076-2
DOI :
10.1109/ICNSC.2007.372818
