Title :
COMPACTEST: A METHOD TO GENERATE COMPACT TEST SETS FOR COMBINATIONAL CIRCUITS
Author :
Pomeranz, Irith ; Reddy, Lakshmi N. ; Reddy, Sudhakar M.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Compaction; Electrical fault detection; Fault detection; Logic testing; Performance evaluation;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519510
