• DocumentCode
    2842869
  • Title

    IMC integrity for Sn96.7-Ag3.7 polymer core solder ball in BGA package

  • Author

    Shih, Tien-Tsorng ; Chen, Bing- Hua ; Lee, Win-Der ; Wang, Mu-Chun

  • Author_Institution
    Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan
  • fYear
    2011
  • fDate
    19-21 Oct. 2011
  • Firstpage
    427
  • Lastpage
    430
  • Abstract
    Since the high-pin count package is strongly desired from the high performance of commercial electronic products, the ball-grid-array (BGA) assembly is indeed suitable to fit this need. Using the polymer core solder ball in lead-free BGA package instead of solid solder ball is a promising choice due to the lighter weight benefiting the self-alignment in solder adhesion reducing the shift ball issue and the good elasticity protecting the clamping substrates, avoiding the leakage or open phenomenon in circuit operation. Comparing the constitution and the IMC thickness among the solid solder ball and polymer core ball groups, the polymer core solder ball demonstrates not only the similar structure, but the better stability in adhesion. By the way, adopting the polymer core solder ball as a bump replacing the conventional SnPb solder bump is also a feasible method in flip-chip package requiring the adhesion metal medium with a lower melting point.
  • Keywords
    ball grid arrays; lead alloys; polymer blends; silver alloys; tin alloys; IMC; Sn-Ag; SnPb; ball grid arrays; commercial electronic products; flip-chip package; high-pin count package; intermetallic compounds; lead-free BGA package; polymer core solder ball; solder bump; solid solder ball; Adhesives; Constitution; Gold; Polymers; Substrates; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4577-1387-3
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2011.6117246
  • Filename
    6117246