DocumentCode :
2842928
Title :
Nickel solder ball performance for Pb-free LFBGA assembly under oxygenous reflow
Author :
Shih, Tien-Tsorng ; Chen, Wei-Chih ; Lee, Win-Der ; Wang, Mu-Chun
Author_Institution :
Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Hsinchu, Taiwan
fYear :
2011
fDate :
19-21 Oct. 2011
Firstpage :
439
Lastpage :
442
Abstract :
Due to the technology improvement of ball-grid-array (BGA) package, the high-pin count concept was derived to the mass production. The low profile fine pitch BGA (LFBGA) package was employed to gain the assembly competition. The smaller diameter of solder ball, 0.3 mm, must be incorporated and the composition of solder ball needs to be modified such as including nickel to strengthen the adhesion capability in IMC layer. Since the oxygen concentration in flow process usually works upon the quality of solder joint such as oxidation causing aged effect and quality of inter-metal compound, the oxygen variance is checked in this study. Furthermore, the flux as solder assistance is also a cardinal factor affecting the solder adherence between LFBGA substrate and solder ball. Adopting the temperature cycling test, shear test and drop test to understand the adhesion ability for lead-free solder balls on LFBGA substrate assisted with several fluxes, the optimal process recipe was obtained. The soldering performance was promoted well.
Keywords :
adhesion; ball grid arrays; oxidation; solders; IMC layer; LFBGA substrate; Pb-free LFBGA assembly; adhesion capability; ball-grid-array package; drop test; high-pin count concept; lead-free solder balls; low profile fine pitch BGA package; mass production; nickel solder ball performance; oxidation; oxygen concentration; oxygenous reflow; shear test; solder assistance; temperature cycling test; Adhesives; Copper; Lead; Nickel; Soldering; Substrates; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4577-1387-3
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2011.6117250
Filename :
6117250
Link To Document :
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