• DocumentCode
    2844047
  • Title

    "RESISTIVE SHORTS" WITHIN CMOS GATES

  • Author

    Hao, Hong ; McCluskey, Edward J.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    292
  • Keywords
    CMOS logic circuits; Circuit faults; Circuit testing; Degradation; Electrical resistance measurement; Logic circuits; Logic gates; Propagation delay; Semiconductor device modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519521
  • Filename
    519521
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2844047