DocumentCode
2844547
Title
Electron cyclotron absorption measurements in a Tokamak plasma using the five channel E-band millimeter wave system
Author
Shen Xuemin
Author_Institution
Inst. of Tech. Phys., Acad. Sinica, Shanghai
fYear
1998
fDate
1998
Firstpage
623
Lastpage
625
Abstract
Electron cyclotron absorption measurements by a multiple-channel millimeter wave system at the electron gyro-frequency have been used for temporal and spatial determination of the optical thickness and electron pressure in Tokamak devices. The instrumentation and technical aspects are reviewed in this paper
Keywords
Tokamak devices; electron density; millimetre wave measurement; plasma diagnostics; E-mode; EHF; O-mode; Tokamak devices; Tokamak plasma; electron cyclotron absorption measurements; electron gyro-frequency; electron pressure; instrumentation; millimeter wave system; multiple-channel MM-wave system; optical thickness; Absorption; Cyclotrons; Electrons; Millimeter wave measurements; Plasma devices; Plasma measurements; Plasma waves; Pressure measurement; Thickness measurement; Tokamaks;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4308-5
Type
conf
DOI
10.1109/ICMMT.1998.768366
Filename
768366
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