DocumentCode
2845010
Title
Combined node and span protection strategies with node-encircling p-cycles
Author
Doucette, John ; Giese, Peter A. ; Grover, Wayne D.
Author_Institution
TRLabs, Edmonton, Alta., Canada
fYear
2005
fDate
16-19 Oct. 2005
Abstract
We develop three new design models for combined node and span protection with a single set of node-encircling p-cycles (NEPCs). In a simple reference model each node is protected by a single dedicated NEPC. In the second model NEPCs can be shared by multiple nodes as needed, and each node is allowed to make use of as many different NEPCs as needed for a capacity-efficient design. To manage the complexity, protection routing is assumed to be evenly split in both directions around the NEPC, resulting in a slight over-provisioning of NEPCs and spare capacity. The final model is the most capacity efficient by virtue of also determining in which direction protection routing should proceed around each NEPC for each light-path affected by a node failure. The models can also permit a specified level of restorability below 100% so that a carrier could offer node-failure restorability on a differentiated service basis. A significant finding is that in test case networks 25% node restorability can be achieved in addition to 100% span restorability with a single integrated set of p-cycles that require as little as 4.1% more spare capacity than for conventional protection only against span-failures.
Keywords
telecommunication network management; telecommunication network reliability; telecommunication network routing; NEPC; capacity-efficient design; direction protection routing; network design; network optimization; network survivability; node restorability; node-encircling p-cycles; node-failure protection; node-failure restorability; node-span protection strategy; reference model; span restorability; test case network; Availability; Design engineering; Design optimization; Electronic mail; Multiprotocol label switching; Optical fiber networks; Optical losses; Protection; Routing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design of Reliable Communication Networks, 2005. (DRCN 2005). Proceedings.5th International Workshop on
Print_ISBN
0-7803-9439-9
Type
conf
DOI
10.1109/DRCN.2005.1563869
Filename
1563869
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