Title :
An integrated threshold gate
Author :
Amodei, J. ; Winder, R. ; Hampel, D. ; Mayhew, T.
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
Keywords :
Aging; Circuit noise; Integrated circuit synthesis; Laboratories; Logic design; Noise level; Packaging; Resistors; Switches;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154549
