• DocumentCode
    2848233
  • Title

    Analysis of the Statistical Properties of the SINR in the IEEE 802.16 OFDMA Network

  • Author

    Moiseev, S.N. ; Filin, S.A. ; Kondakov, M.S. ; Garmonov, A.V. ; Do Hyon Yim ; Jaeho Lee

  • Author_Institution
    JSC Kodofon, Voronezh, Russia. smoiseev@kodofon.vrn.ru
  • Volume
    12
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    5595
  • Lastpage
    5599
  • Abstract
    In the IEEE 802.16 network the SINR per subcarrier, the average SINR, and the SINR RMS are stochastic processes. In this paper, we analyze the statistical properties of these stochastic processes using system level simulation. We present the probability density functions for the SINR per subcarrier and the average SINR stochastic processes expressed in both logarithmic and linear scales. We also present the probability density function for the SINR RMS stochastic process, expressed in the logarithmic scale. The results, obtained in this paper, allow using the statistical approach while developing the adaptive transmission algorithms for the IEEE 802.16 network.
  • Keywords
    Analytical models; Error probability; Interference; Laser sintering; OFDM; Probability density function; Root mean square; Signal to noise ratio; Stochastic processes; System performance; IEEE 802.16; OFDMA; SINR; probability density function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 2006. ICC '06. IEEE International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    8164-9547
  • Print_ISBN
    1-4244-0355-3
  • Electronic_ISBN
    8164-9547
  • Type

    conf

  • DOI
    10.1109/ICC.2006.255553
  • Filename
    4024953