DocumentCode
2848233
Title
Analysis of the Statistical Properties of the SINR in the IEEE 802.16 OFDMA Network
Author
Moiseev, S.N. ; Filin, S.A. ; Kondakov, M.S. ; Garmonov, A.V. ; Do Hyon Yim ; Jaeho Lee
Author_Institution
JSC Kodofon, Voronezh, Russia. smoiseev@kodofon.vrn.ru
Volume
12
fYear
2006
fDate
38869
Firstpage
5595
Lastpage
5599
Abstract
In the IEEE 802.16 network the SINR per subcarrier, the average SINR, and the SINR RMS are stochastic processes. In this paper, we analyze the statistical properties of these stochastic processes using system level simulation. We present the probability density functions for the SINR per subcarrier and the average SINR stochastic processes expressed in both logarithmic and linear scales. We also present the probability density function for the SINR RMS stochastic process, expressed in the logarithmic scale. The results, obtained in this paper, allow using the statistical approach while developing the adaptive transmission algorithms for the IEEE 802.16 network.
Keywords
Analytical models; Error probability; Interference; Laser sintering; OFDM; Probability density function; Root mean square; Signal to noise ratio; Stochastic processes; System performance; IEEE 802.16; OFDMA; SINR; probability density function;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, 2006. ICC '06. IEEE International Conference on
Conference_Location
Istanbul
ISSN
8164-9547
Print_ISBN
1-4244-0355-3
Electronic_ISBN
8164-9547
Type
conf
DOI
10.1109/ICC.2006.255553
Filename
4024953
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