DocumentCode
2848611
Title
Intrinsic resolution of ceramic YAG(Ce), GYAG(Ce), and YAG(Ce,Nd) scintillators
Author
Yanagida, Takayuki ; Yoshikawa, Akira ; Kawaharada, Madoka ; Itoh, Takeshi ; Saito, Fumio
Author_Institution
Tohoku Univ., Sendai
Volume
2
fYear
2007
fDate
Oct. 26 2007-Nov. 3 2007
Firstpage
1343
Lastpage
1346
Abstract
We developed transparent ceramic scintillators of Ce doped YAG, Ce and Nd codoped YAG, and Ce doped (GdY)AG, respectively. We cut them with a size of 5 times 5 times 5 mm3 for Ce:YAG and (Ce,Nd):YAG, and 5 times 5 times 2 mm3 for Ce:GYAG. At three temperature conditions, such as +20, 0, and -20degC, a temperature dependence of a light yield are measured, when they are coupled with avalanche photo diode, which is a S8664-55 type APD manufactured by Hamamatsu photonics. In these conditions, light yield of them turned out to be ~0.4, ~0.1, and ~0.25 times as large as that of Tl:CsI crystal. All of them show little temperature dependence of less than 10% in this 40 K temperature change. By measuring circuit noise and statistical noise due to excess noise factor of APD measurement system, we also study the temperature dependence of intrinsic energy resolution of these scintillators, in the range of 60 to 1400 keV. There are little temperature dependence observed, and it turned out to be about 5% at several hundreds keV.
Keywords
avalanche photodiodes; ceramics; nuclear electronics; readout electronics; scintillation counters; GYAG(Ce) scintillators; Hamamatsu Photonics; YAG(Ce) scintillators; YAG(Ce,Nd) scintillators; avalanche photodiode; ceramic scintillators; circuit noise; electron volt energy 60 keV to 1400 keV; intrinsic resolution; light yield; scintillation light readout detector; statistical noise; temperature -20 C; temperature 0 C; temperature 20 C; Ceramics; Circuit noise; Diodes; Energy measurement; Manufacturing; Neodymium; Noise measurement; Optical coupling; Photonics; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location
Honolulu, HI
ISSN
1095-7863
Print_ISBN
978-1-4244-0922-8
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2007.4437250
Filename
4437250
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