• DocumentCode
    2849034
  • Title

    Introduction of JIS related to lead-free solder and soldering

  • Author

    Takemoto, Tadashi

  • Author_Institution
    Joining & Welding Res. Inst., Osaka Univ., Ibaraki, Japan
  • fYear
    2005
  • fDate
    30 Aug.-2 Sept. 2005
  • Firstpage
    8
  • Lastpage
    12
  • Abstract
    Toward July 1, 2006, almost all major electric and electronic manufacturing companies have been finished their development on lead-free soldering in Japan. To support the promotion of practical use of lead-free solder, preparation of standards is effective. The outline of standards for lead-free solder under preparation in JIS, ISO and IEC is briefly reviewed. To coordinate among these standards is quite important to avoid double standards. The main solders to be included in these standards are Sn-Sb, Sn-Cu(-Ag), Sn-Ag-Cu, Sn-Ag-In-Bi, Sn-Zn and Sn-Bi(-Ag). The most popular alloy systems is Sn-Ag-Cu, in Japan Sn-3.0Ag-0.5Cu is a normally used solder. The ideal standards should have material specification and test methods for solder, flux and mixture of them. In Japan Solder Research Committee of Japan Welding Engineering Society (JWES) is corresponding to both ISO and IEC to enhance consistency among the standards related to lead-free solder. The JIS of test method for lead-free solders had been already published in 2003 as JIS Z 3198-Part 1 ∼Part 7. They include the measurement for melting temperature range, mechanical properties by a tensile test, wettability tests and joint strength tests. According to the test method specified in JIS Z 3198-1, Solder Research Committee of JWES determined the melting temperature range of all lead-free solders that will be adopted in JIS.
  • Keywords
    antimony alloys; bismuth alloys; copper alloys; electron device manufacture; electronics industry; indium alloys; materials testing; silver alloys; soldering; solders; standards; tin alloys; IEC; ISO; JIS; Sn-Ag-In-Bi; Sn-Bi-Ag; Sn-Cu-Ag; Sn-Sb; Sn-Zn; Sn3.0Ag0.5Cu; alloy systems; electric manufacturing; electronic manufacturing; joint strength tests; lead free solder; material specification; soldering; standards; tensile test; test methods; wettability tests; Environmentally friendly manufacturing techniques; IEC standards; ISO standards; Lead; Materials testing; Mechanical variables measurement; Soldering; Temperature distribution; Temperature measurement; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2005 6th International Conference on
  • Print_ISBN
    0-7803-9449-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2005.1564644
  • Filename
    1564644