• DocumentCode
    2849580
  • Title

    Impurity distribution in high efficiency silicon trapatt devices

  • Author

    Assour, J.

  • Author_Institution
    RCA Laboratories, Princeton, NJ, USA
  • Volume
    XIII
  • fYear
    1970
  • fDate
    18-20 Feb. 1970
  • Firstpage
    204
  • Lastpage
    204
  • Abstract
    Lists informal discussion sessions held at the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1970 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1970.1154831
  • Filename
    1154831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2849580