Title :
Assessing model adequacy in integrated-curcuit simulation
Author :
Lindholm, F. ; Director, S.
Author_Institution :
University of Florida, Gainesville, Florida, USA
Abstract :
A method for assessing the adequacy of transistor models in integrated-circuit simulation programs will be offered. For each transistor in a circuit the method yields the model of least complexity consistent with required accuracy.
Keywords :
Automatic testing; Bipolar transistors; Breakdown voltage; Circuit analysis computing; Circuit simulation; Circuit testing; Computational modeling; Computerized monitoring; Laboratories; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1971 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1971.1154924
