Schematic-Based Fault Dictionary: A Case Study

Author

AbdEl-Halim, Mohammed Ali ; Amer, Hassanein H.

Author_Institution

Mentor Graphics Egypt, Cairo

fYear

2007

fDate

16-18 Dec. 2007

Firstpage

257

Lastpage

260

Abstract

This paper uses the opamp1 benchmark circuit to show that existing fault models are not accurate enough in the context of defect-based tests. A simple DFT circuit is added to increase coverage to 100% without affecting normal circuit operation. Furthermore, it is shown that this DFT circuit changes the operation modes of insensitive transistors.

Keywords

analogue circuits; circuit testing; discrete Fourier transforms; fault location; operational amplifiers; DFT; analog mixed signal test; defect-based tests; discrete Fourier transform; insensitive transistor; opamp1 benchmark circuit; schematic-based fault dictionary; Built-in self-test; Circuit faults; Circuit testing; Costs; Design engineering; Design for testability; Dictionaries; Performance evaluation; Production; Prototypes; Induced Fault analysis; analog fault model; analog mixed signal test; defect-based analog test; fault dictionary;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Test Workshop, 2007. IDT 2007. 2nd International

Conference_Location

Cairo

Print_ISBN

978-1-4244-1824-4

Electronic_ISBN

978-1-4244-1825-1

Type

conf

DOI

10.1109/IDT.2007.4437472

Filename

4437472

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2851889