Title :
High performance photo-sensitive insulating materials for MCM-L
Author :
Akahoshi, Haruo ; Kawamoto, Mineo ; Suwa, Tokihito ; Miyazaki, Masashi ; Fukai, Hiroyuki
Author_Institution :
Res. Lab., Hitachi Ltd., Ibaraki, Japan
Abstract :
The sequential build-up process with photo-sensitive dielectric is a most significant candidate for achieving high density multilayer wiring substrates for low cost multichip modules. A high performance dielectric material is essential in order to obtain high reliability on the wiring substrate. Two types of photo-imageable dielectric have been developed: an aqueous alkaline developable type and a semi-aqueous developable type. The results of the performance evaluation of the dielectric materials and sequential build-up wiring substrates are described here. Both dielectric types deliver high resolution in fabricating photo-formed micro-via holes. The maximum aspect ratio of the micro-via has reached 1.0 for both materials. The aqueous developable type photodielectric showed excellent electrical and mechanical properties for surface mount wiring boards with a panel electroplate subtractive process. The semi-aqueous type high performance photo-dielectric, designed for MCM-L, showed outstanding mechanical properties especially in a high temperature region. Excellent insulating properties and adhesion were proven even after pressure cooker test (PCT) conditions. Sufficient adhesion for full-build electroless copper metallization was also achieved. These features offer a great advantage in achieving higher interconnect reliability in direct chip attachment on low cost multichip modules using sequential build-up substrates
Keywords :
adhesion; dielectric thin films; electroless deposition; flip-chip devices; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; integrated circuit reliability; laminates; microassembling; multichip modules; photochemistry; photolithography; surface mount technology; Cu; MCM-L; adhesion; aqueous alkaline developable dielectric; aqueous developable photodielectric; dielectric material; dielectric materials; direct chip attachment; electrical properties; full-build electroless copper metallization; high density multilayer wiring substrates; insulating properties; interconnect reliability; mechanical properties; micro-via aspect ratio; multichip modules; panel electroplate subtractive process; performance evaluation; photo-formed micro-via holes; photo-imageable dielectric; photo-sensitive dielectric; photo-sensitive insulating materials; pressure cooker test conditions; semi-aqueous developable dielectric; semi-aqueous photo-dielectric; sequential build-up process; sequential build-up substrates; sequential build-up wiring substrates; surface mount wiring boards; wiring substrate reliability; Adhesives; Costs; Dielectric materials; Dielectric substrates; Dielectrics and electrical insulation; Materials reliability; Mechanical factors; Multichip modules; Nonhomogeneous media; Wiring;
Conference_Titel :
Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-4850-8
DOI :
10.1109/ICMCM.1998.670782