• DocumentCode
    2852080
  • Title

    RF library based on block diagram and behavioral descriptions

  • Author

    Nicolle, Benjamin ; Tatinian, William ; Jacquemod, Gilles ; Mayol, Jean-José ; Oudinot, Jean

  • Author_Institution
    LEAT, Valbonne
  • fYear
    2007
  • fDate
    20-21 Sept. 2007
  • Firstpage
    52
  • Lastpage
    57
  • Abstract
    This paper presents a RF behavioral library. The objective of this library is to validate the future RF transceiver system, for example for BER specifications. The library includes key RF blocks such as Low Noise Amplifier, Channel, Mixers, Power Amplifier, Filters, used in RF transceivers. The model is based on block diagram and behavioral descriptions. The models present two aspects, the first is based on the development of RTL code. The second uses the advantages of block diagram simulator as phase noise and noise figure generation to reduce drawbacks of behavioral limitations and the complete library is available in a unified simulation RF environment to simplify the simulation setup overhead, hence reducing simulation time while still obtaining acceptable accuracy versus Spice level simulation.
  • Keywords
    circuit simulation; diagrams; digital simulation; error statistics; formal specification; hardware description languages; integrated circuit design; logic CAD; low-power electronics; radiofrequency integrated circuits; software libraries; transceivers; BER specifications; RF behavioral library; RF transceiver system; RTL code; behavioral descriptions; block diagram simulator; integrated circuit design difficulties; low noise amplifier; power amplifier; Bit error rate; Libraries; Low-noise amplifiers; Noise figure; Phase noise; Power filters; Power system modeling; Radio frequency; Radiofrequency amplifiers; Transceivers; Behavioral; Circuit simulation; Library; Mixed; Modeling; RF; Simulation software; Transceiver;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Workshop, 2007. BMAS 2007. IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-1567-0
  • Type

    conf

  • DOI
    10.1109/BMAS.2007.4437524
  • Filename
    4437524