DocumentCode :
2852780
Title :
X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR
Author :
Touba, Nur A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas, Austin, TX
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
10
Abstract :
A new X-tolerant multiple-input signature register (MISR) compaction methodology is proposed which can compact output streams containing unknown (X) values. Unlike conventional X-masking approaches, it does not require any masking logic at the input of the MISR. Instead it uses symbolic simulation to express each bit of the MISR signature as a linear equation in terms of the X´s. Linearly dependent combinations of the signature bits are identified with Gaussian elimination and XORed together using a programmable XOR to cancel out all X values thereby yielding deterministic values that are invariant of what the final values of the X´s end up being during the test. These X-canceled values can be compacted in a separate MISR to generate a final X-free signature. Each intermediate signature for an m-bit MISR can tolerate k X´s present anywhere in the output stream with error detection capability equivalent to using an m-k bit MISR with no unknowns. The tester storage requirement is a small constant times the total number of unknowns in the test set and thus does not depend on the scan architecture, the number of test vectors, or the distribution of X´s which is a key advantage compared with other X-tolerant compaction schemes.
Keywords :
Gaussian processes; digital signatures; Gaussian elimination; X-canceling MISR; X-tolerant methodology; X-tolerant multiple-input signature register; compact output streams containing unknown; error detection capability; linear equation; programmable XOR; symbolic simulation; Circuit faults; Circuit testing; Clocks; Combinational circuits; Compaction; Equations; Error correction codes; Hardware; Logic; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2007.4437576
Filename :
4437576
Link To Document :
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