• DocumentCode
    2852791
  • Title

    A stochastic formulation of successive software releases with faults severity

  • Author

    Singh, Ompal ; Kapur, P.K. ; Anand, Adarsh

  • Author_Institution
    Dept. of Operational Res., Univ. of Delhi, Delhi, India
  • fYear
    2011
  • fDate
    6-9 Dec. 2011
  • Firstpage
    136
  • Lastpage
    140
  • Abstract
    Software companies are coming with multiple add-ons to survive in the pure competitive environment. Each succeeding up-gradation offers some performance enhancement and distinguishing itself from the past release. If the size of the software system is large, the number of faults detected during the testing phase becomes large, and the number of faults, which are removed through each debugging, becomes small compared to initial fault content at the beginning of the testing phase. In such a situation, we can model the software fault detection process as a stochastic process with continuous state space. In this paper, we propose a multi-release software reliability growth model based on Itô´s type of differential equation. The model categorizes Faults in two categories: simple and hard with respect to time which they take for isolation and removal after their observation. The model developed is validated on real data set.
  • Keywords
    differential equations; program debugging; program testing; software fault tolerance; software performance evaluation; stochastic processes; Itô´s type; differential equation; faults severity; multirelease software reliability growth model; performance enhancement; software companies; software fault detection process; software releases; software system; stochastic process; testing phase; Equations; Fault detection; Mathematical model; Software; Software reliability; Stochastic processes; Testing; Add-ons; Software Reliability Growth Models (SRGM); Up-Gradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
  • Conference_Location
    Singapore
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4577-0740-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2011.6117894
  • Filename
    6117894