• DocumentCode
    2852945
  • Title

    Liquid helium temperature analog operation of asymmetric self-cascode FD SOI MOSFETs

  • Author

    de Souza, M. ; Kilchtyska, Valeriya ; Flandre, Denis ; Pavanello, Marcelo Antonio

  • Author_Institution
    Dept. of Electr. Eng., Centro Univ. da FEI, São Bernardo do Campo, Brazil
  • fYear
    2012
  • fDate
    1-4 Oct. 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This work reports, for the first time, experimental results of asymmetric self-cascode FD SOI n and pMOSFETs operating at liquid helium temperature. The results show that the improved analog performance obtained by this architecture at room temperature is maintained even for such extreme low temperature, promoting the reduction of impact ionization and parasitic bipolar effects, which may even be suppressed, depending on the threshold voltages of the devices. Although the use of A-SC may cause a small (5-10% for nMOS devices) decrease of the unit-gain frequency at certain bias conditions, the output conductance reduction in A-SC results in the rise of the intrinsic voltage gain that has shown to increase by up to 32 dB and 30 dB for A-SC n and pMOSFETs, respectively, in comparison to ST at 4.2K. The gain improvement at 4.2K has shown to be larger than at 300K at the same current level.
  • Keywords
    MOSFET; ionisation; liquid helium; silicon-on-insulator; A-SC; asymmetric self-cascode FD SOI nMOSFET; fully depleted SOI technology; impact ionization reduction; intrinsic voltage gain; liquid helium temperature analog operation; nMOS devices; output conductance reduction; pMOSFET; parasitic bipolar effects; temperature 293 K to 298 K; temperature 4.2 K; unit-gain frequency; Degradation; Helium; MOSFETs; Semiconductor device measurement; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2012 IEEE International
  • Conference_Location
    NAPA, CA
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-4673-2690-2
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2012.6404377
  • Filename
    6404377