Title :
A class of 2-step diagnosable systems: degree off diagnosability and a diagnosis algorithm
Author :
Huang, Kaiyuan ; Das, Anindya ; Agarwal, Vinod K. ; Thulasiraman, K.
Author_Institution :
McGill Univ., Montreal, Que., Canada
Abstract :
A diagnosability measure called t/-1-diagnosability is introduced. A system is t/-1-diagnosable if at least f-1 faulty units can be identified as long as the number of faulty units present, f, does not exceed t and the system is 1-fault diagnosable. This class of diagnosable systems is fully characterized. In addition, an O(n3.5) diagnosis algorithm that locates at least f-1 faulty units when 1<f⩽t or the only faulty unit when f=1 is provided. When there is no faulty unit the algorithm certifies it. The algorithm is suited for any t/-1-diagnosable system
Keywords :
directed graphs; fault tolerant computing; system recovery; diagnosability; diagnosis algorithm; faulty units; t/-1-diagnosability; two-step diagnosable system; Fault diagnosis; Hypercubes; Multiprocessing systems; System testing;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.229930