• DocumentCode
    2853714
  • Title

    Novel compensation scheme for local clocks of high performance microprocessors

  • Author

    Metra, C. ; Omaña, M. ; Mak, TM ; Tarn, S.

  • Author_Institution
    DEIS, Bologna Univ., Bologna
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Clock compensation for process variations and manufacturing defects is a key strategy to achieve high performance of processors and high end ASIC. However, with the increase in process variations and defect densities, clock compensation is becoming increasingly challenging. A clock distribution system also consumes over 30% of the overall chip level power, so every little bit counts, including compensation schemes. In this paper we propose a new scheme for the compensation of undesirable skews and duty-cycle variations of local clocks of high performance microprocessors and high end ASICs. Our scheme performs compensation continuously, during the microprocessor operation, thus allowing also compensation to clock jitters due to environmental influences during operation. Compared to alternate solutions for local clock compensation, our scheme features lower power consumption, smaller compensation error, and a lower or comparable area overhead, while allowing compensation to be accomplished within the same clock cycle of skew or duty-cycle variation.
  • Keywords
    application specific integrated circuits; clocks; microprocessor chips; ASIC; clock compensation; clock distribution system; clock jitters; compensation scheme; duty-cycle variations; high performance microprocessors; local clocks; lower power consumption; Application specific integrated circuits; Clocks; Degradation; Energy consumption; Flip-flops; Frequency; Jitter; Manufacturing processes; Microprocessors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437645
  • Filename
    4437645