DocumentCode
285377
Title
Choosing a filter structure: component sensitivity and design-for-testability
Author
DeBrunner, V.E.
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Oklahoma Univ., Norman, OK, USA
Volume
1
fYear
1992
fDate
10-13 May 1992
Firstpage
240
Abstract
The choice of filter structure and its effects on circuit test and implementation sensitivity are examined. Preliminary results have shown the lattice structure to often have a low relative structure-algorithm time constant, making it a strong candidate for implementation in many applications. Since the parameters of such systems can be easily determined from input/output data, and the system design is insensitive to the design parameters, such structures can be used to advantage where design-for-testability is needed
Keywords
design for testability; filters; network parameters; sensitivity analysis; circuit test sensitivity; component sensitivity; design-for-testability; filter structure; implementation sensitivity; lattice structure; Circuit testing; Computer science; Convergence; Fault detection; Filters; Integrated circuit interconnections; Lattices; Parameter estimation; Structural engineering; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0593-0
Type
conf
DOI
10.1109/ISCAS.1992.229969
Filename
229969
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