• DocumentCode
    285377
  • Title

    Choosing a filter structure: component sensitivity and design-for-testability

  • Author

    DeBrunner, V.E.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oklahoma Univ., Norman, OK, USA
  • Volume
    1
  • fYear
    1992
  • fDate
    10-13 May 1992
  • Firstpage
    240
  • Abstract
    The choice of filter structure and its effects on circuit test and implementation sensitivity are examined. Preliminary results have shown the lattice structure to often have a low relative structure-algorithm time constant, making it a strong candidate for implementation in many applications. Since the parameters of such systems can be easily determined from input/output data, and the system design is insensitive to the design parameters, such structures can be used to advantage where design-for-testability is needed
  • Keywords
    design for testability; filters; network parameters; sensitivity analysis; circuit test sensitivity; component sensitivity; design-for-testability; filter structure; implementation sensitivity; lattice structure; Circuit testing; Computer science; Convergence; Fault detection; Filters; Integrated circuit interconnections; Lattices; Parameter estimation; Structural engineering; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0593-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1992.229969
  • Filename
    229969