DocumentCode
2854510
Title
Automotive IC's: less testing, more prevention
Author
Appello, Davide
Author_Institution
STMicroelectron. s.r.L, Agrate Brianza
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
2
Abstract
Electronics is relentlessly gaining new space in automotive. Different application types are converging into the car to increase comfort, performances, safety and entertainment. Many of these applications come from the so-called "consumer" domain which is traditionally undergoing to less severe quality constraints with respect to "automotive grade" products. Automotive products are often heavily tested, with multiple passes, and by monitoring quality indicators used as acceptance tests. Cost of test per each finished good is inevitably growing. On the other hand, average price of automotive products is constantly decreasing. Adding always more does test not necessarily means also improving product quality. Or at least, there might be smarter way to get better results.
Keywords
automotive electronics; integrated circuit testing; monitoring; quality control; IC testing; automotive electronics; automotive product; car safety; quality indicator monitoring; Automotive engineering; Circuit faults; Costs; Design for manufacture; Design for testability; Electronic equipment testing; Monitoring; Performance evaluation; Semiconductor device modeling; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2007.4437699
Filename
4437699
Link To Document