• DocumentCode
    2854510
  • Title

    Automotive IC's: less testing, more prevention

  • Author

    Appello, Davide

  • Author_Institution
    STMicroelectron. s.r.L, Agrate Brianza
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Electronics is relentlessly gaining new space in automotive. Different application types are converging into the car to increase comfort, performances, safety and entertainment. Many of these applications come from the so-called "consumer" domain which is traditionally undergoing to less severe quality constraints with respect to "automotive grade" products. Automotive products are often heavily tested, with multiple passes, and by monitoring quality indicators used as acceptance tests. Cost of test per each finished good is inevitably growing. On the other hand, average price of automotive products is constantly decreasing. Adding always more does test not necessarily means also improving product quality. Or at least, there might be smarter way to get better results.
  • Keywords
    automotive electronics; integrated circuit testing; monitoring; quality control; IC testing; automotive electronics; automotive product; car safety; quality indicator monitoring; Automotive engineering; Circuit faults; Costs; Design for manufacture; Design for testability; Electronic equipment testing; Monitoring; Performance evaluation; Semiconductor device modeling; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437699
  • Filename
    4437699