Title :
Statistical bipolar circuit design using MSTAT
Author :
Salamina, N. ; Rencher, M.R.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Abstract :
A technique for performing statistical circuit design has been developed that provides the accuracy required for bipolar designs. This has been accomplished through the development of a prototype system, MSTAT (Motorola statistical analysis tool). The statistical techniques that MSTAT supports to determine circuit performance and yield are screening (Plackett-Burman) and RSM (response surface methodology) Monte Carlo analysis is used to predict circuit constraints using the derived polynomial equation produced by RSM. An example is included to demonstrate the system capabilities.<>
Keywords :
Monte Carlo methods; bipolar integrated circuits; circuit CAD; integrated circuit technology; polynomials; statistical analysis; Monte Carlo analysis; Motorola statistical analysis tool; bipolar circuit; circuit performance; polynomial equation; response surface methodology; screening; statistical circuit design; yield; Analog integrated circuits; Circuit optimization; Circuit simulation; Circuit synthesis; Circuit testing; Data mining; Integrated circuit yield; Predictive models; Response surface methodology; Statistical analysis;
Conference_Titel :
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-1986-4
DOI :
10.1109/ICCAD.1989.76935
