KLT analysis of brain potential maps during pain

Author

Brauer, Friedemann ; Dick, Bruce D. ; Stroink, Gerhard ; Connolly, John F. ; McGrath, Patrick J. ; Finley, G. Allen

Author_Institution

Dept. of Phys., Dalhousie Univ., Halifax, NS, Canada

Volume

4

fYear

2000

fDate

2000

Firstpage

2755

Abstract

The effect of pain on event related potentials was analyzed with spatial Karhunen-Loeve Transforms (KLT) of maps from 54-lead EEG recordings. The recordings were obtained using an auditory oddball paradigm, during pain and no-pain conditions. Group eigenfunctions were calculated from the mismatch negativity (MMN) responses of twelve subjects. The individual data for pain and no-pain conditions, respectively, were fitted with these group eigenfunctions across the conditions. In seven of the twelve subjects, the resulting fitting error was larger when pain eigenfunctions were fitted to control data rather than to pain data. This suggests that spatial features of the potential maps might be used as a means for differentiating between pain and no-pain conditions

Keywords

Karhunen-Loeve transforms; auditory evoked potentials; electroencephalography; medical signal processing; 54-lead EEG recordings; KLT analysis; auditory oddball paradigm; brain potential maps during pain; fitting error; group eigenfunctions; no-pain conditions; pain measurement; spatial features; Band pass filters; Brain; Digital filters; Eigenvalues and eigenfunctions; Electroencephalography; Karhunen-Loeve transforms; Pain; Particle measurements; Pediatrics; Scalp;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE

Conference_Location

Chicago, IL

ISSN

1094-687X

Print_ISBN

0-7803-6465-1

Type

conf

DOI

10.1109/IEMBS.2000.901431

Filename

901431