DocumentCode :
2855611
Title :
Outlier detection to identify artefacts in EEG signals
Author :
Cluitmans, Pierre J M ; Van de Velde, Maarten
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
Volume :
4
fYear :
2000
fDate :
2000
Firstpage :
2825
Abstract :
A method is presented to identify artefacts in clinical EEG recordings. The method is based upon the assumption that artefacts manifest themselves as outliers in one or more EEG-derived parameters. Parameters used are primarily derived from a 5th order autoregressive model, fitted to each subsequent second of EEG data. The method results in a set of threshold detection rules that identify outliers in parameter space. Detection thresholds are derived from an analysis of the experimental cumulative distribution function in a training set of clinical EEG recordings, annotated by a human observer
Keywords :
electroencephalography; medical signal detection; 5th order autoregressive model; EEG-derived parameters; artefacts identification; clinical EEG recordings; electrodiagnostics; experimental cumulative distribution function; human observer; neuromonitoring; outlier detection; supervised training; threshold detection rules; training set; Accuracy; Biomedical measurements; Brain modeling; Distribution functions; Electroencephalography; Humans; Impedance; Signal processing; Testing; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1094-687X
Print_ISBN :
0-7803-6465-1
Type :
conf
DOI :
10.1109/IEMBS.2000.901453
Filename :
901453
Link To Document :
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