• DocumentCode
    2855992
  • Title

    CCD memory options

  • Author

    Collins, David ; Barton, Jay H. ; Buss, D. ; Kmetz, A. ; Schroeder, Jochen

  • Author_Institution
    Texas Instruments Corp., Dallas, TX, USA
  • Volume
    XVI
  • fYear
    1973
  • fDate
    14-16 Feb. 1973
  • Firstpage
    136
  • Lastpage
    137
  • Abstract
    Implementation of Al-Al2O3-Al metalization, experimental performance of diverse CCDs, and a novel two-phase concept will be presented, within a discussion of the organization and fabrication tradeoffs for analog and digital memories, citing predicted impact.
  • Keywords
    Aluminum; Charge coupled devices; Clocks; Conductivity; Electrodes; Fluid flow measurement; Metallization; Phased arrays; Shift registers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1973.1155221
  • Filename
    1155221
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2855992