DocumentCode
2856201
Title
Dynamic test compaction for bridging faults
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng, Purdue Univ., West Lafayette, IN, USA
fYear
2005
fDate
21-23 March 2005
Firstpage
250
Lastpage
255
Abstract
We describe a dynamic test compaction procedure for four-way bridging faults. Under this fault model, a pair of lines gi, gj is associated with four bridging faults corresponding to two possible combinations of opposite values on gi and gj, and two options for the line whose value is faulty in the presence of the fault (either gi or gj). Compaction is achieved by simultaneously considering faults that have a line gi with a value αi in common, such that the value αi on gi is affected by the presence of the fault. Faults with a common line gi and value αi differ only in the second line gj of each pair of bridged lines, and the second lines only need to be assigned the value α~i in order to detect all the faults. This strong relationship between the faults allows us to derive tests that detect large numbers of these faults, resulting in compact test sets.
Keywords
fault simulation; logic testing; compact test sets; dynamic test compaction; fault model; four-way bridging faults; full-scan circuits; Circuit faults; Circuit testing; Cities and towns; Compaction; Delay; Electrical fault detection; Fault detection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN
0-7695-2301-3
Type
conf
DOI
10.1109/ISQED.2005.48
Filename
1410592
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