Optimization of individual well adaptive body biasing (IWABB) using a multiple objective evolutionary algorithm

Author

Gregg, Justin ; Chen, Tom W.

Author_Institution

Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA

fYear

2005

fDate

21-23 March 2005

Firstpage

297

Lastpage

302

Abstract

Mitigating the effects process variations on power-frequency distributions can be done by using a system of locally-generated body biases. This system allows for highly localized circuit optimizations with very little overhead in silicon area and routing resources. We present a multiple objective algorithm to find near-optimal configurations of these biases which can be applied during post-fabrication testing. The system can improve an initial yield of 12% to 77%.

Keywords

circuit optimisation; evolutionary computation; integrated circuit testing; integrated circuit yield; circuit optimization; individual well adaptive body biasing; multiple objective algorithm; multiple objective evolutionary algorithm; post-fabrication testing; power-frequency distributions; process variations; routing resources; silicon area; yield improvement; Circuit optimization; Circuit testing; Distributed computing; Evolutionary computation; Manufacturing processes; Power engineering and energy; Power engineering computing; Routing; Silicon; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on

Print_ISBN

0-7695-2301-3

Type

conf

DOI

10.1109/ISQED.2005.87

Filename

1410599