Title :
Functional verification of networked embedded systems
Author :
Bombieri, Nicola ; Fummi, Franco ; Pravadelli, Nicola Bombieri Franco Fummi Graziano
Author_Institution :
Dipt. di Inf., Verona Univ., Italy
Abstract :
We propose an automatic mechanism to extract the environment of a networked embedded system (NEV), and a functional verification methodology, which mixes automatic test pattern generation and model checking, exploiting the network environment constraints.
Keywords :
automatic test pattern generation; embedded systems; integrated circuit modelling; ATPG; automatic test pattern generation; functional verification methodology; model checking; networked embedded systems; Automatic test pattern generation; Circuit faults; Circuit testing; Electrical fault detection; Embedded system; Fault detection; Logic testing; Sequential analysis; Switches; Test pattern generators;
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
DOI :
10.1109/ISQED.2005.59
