Title :
Extended Thevenin models for transient analysis of non-uniform dispersive lossy multiconductor transmission lines
Author :
Dhaene, Tom ; De Zutter, Daniël
Author_Institution :
Lab. of Electromagn. & Acoust., Ghent Univ., Belgium
Abstract :
The authors present a new time-varying equivalent circuit model for transient analysis of uniform and nonuniform multiconductor transmission lines with arbitrary linear and nonlinear loads. Calculated or measured scattering parameter data are used to characterize the interconnection structures. Both sides of the transmission line structure are modeled as extended Thevenin equivalents, which consist of constant resistances and time-dependent voltage sources. This new circuit model is compatible with existing simulation programs
Keywords :
equivalent circuits; microstrip lines; time-varying networks; transient response; transmission line theory; circuit model; constant resistances; dispersive transmission lines; existing simulation programs; extended Thevenin models; interconnection; linear loads; lossy transmission lines; microstrip lines; multiconductor transmission lines; nonlinear loads; nonuniform transmission lines; scattering parameter data; time-dependent voltage sources; time-varying equivalent circuit model; transient analysis; transmission line structure; Circuit simulation; Distributed parameter circuits; Electrical resistance measurement; Equivalent circuits; Integrated circuit interconnections; Multiconductor transmission lines; Scattering parameters; Transient analysis; Transmission line measurements; Voltage;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230411