DocumentCode
2857231
Title
Enhanced self-configurability and yield in multicore grids
Author
Kolonis, E. ; Nicolaidis, M. ; Gizopoulos, D. ; Psarakis, M. ; Collet, J.H. ; Zajac, P.
Author_Institution
Dept. of Inf., Univ. of Piraeus, Piraeus, Greece
fYear
2009
fDate
24-26 June 2009
Firstpage
75
Lastpage
80
Abstract
As we move deeper in the nanotechnology era, computer architecture is solicited to manipulate tremendous numbers of devices per chip with high defect densities. These trends provide new computing opportunities but efficiently exploiting them will require a shift towards novel, highly parallel architectures. Fault tolerant mechanisms will have to be integrated to the design to deal with the low yield of future nanofabrication processes. In this paper we consider multi processor grid (MPG) architectures that assure scalability beyond hundreds of cores per chip. We study self-diagnosis and self-configuration methods at the architectural level and propose an enhanced self-configuration methodology that enables usage of a maximum percentage of available fault-free cores in MPGs with high defect densities. We show that our approach achieves usability of all fault-free cores for the case of fault-free routers whereas previous work was efficient for defect densities of up to 20-25% of defective cores. We also address the case of faulty routers, achieving usability of almost all fault-free nodes (fault-free cores having a fault-free router) for very high defect densities both in the cores and in the routers.
Keywords
fault tolerant computing; grid computing; multiprocessing systems; nanofabrication; parallel architectures; fault tolerant mechanisms; fault-free cores; multicore grids; multiprocessor grid; nanofabrication; parallel architecture; self-configurability; self-configuration; self-diagnosis; Computer architecture; Computer science; Fault tolerance; Informatics; Laboratories; Microelectronics; Multicore processing; Nanotechnology; Parallel architectures; Usability;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location
Sesimbra, Lisbon
Print_ISBN
978-1-4244-4596-7
Electronic_ISBN
978-1-4244-4595-0
Type
conf
DOI
10.1109/IOLTS.2009.5195986
Filename
5195986
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