DocumentCode :
2858073
Title :
Simplified peripheral circuits for a marginally testable 4K RAM
Author :
Foss, Richard ; Harland, Robert
Author_Institution :
Microsystems International, Ltd., Ottawa, Canada
Volume :
XVIII
fYear :
1975
fDate :
27426
Firstpage :
102
Lastpage :
103
Abstract :
The peripheral circuits of a 4K RAM, simplified to allow a chip size of 122 × 165 mils, with a 5-mask process, will be described. Testing affords measurement of the internal safe operating margins, where the signal levels are 106electrons or 160 mV.
Keywords :
Capacitance; Circuit testing; Clocks; Energy consumption; Flip-flops; Protection; Random access memory; Read-write memory; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Type :
conf
DOI :
10.1109/ISSCC.1975.1155354
Filename :
1155354
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2858073
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