DocumentCode
2858630
Title
Robust finite-duration transient response of micro-electromechanical system
Author
Choong-Ho Rhee ; Oldham, K.
Author_Institution
Dept. of Mech. Eng., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2011
fDate
June 29 2011-July 1 2011
Firstpage
3471
Lastpage
3476
Abstract
A time-domain robust control design approach for minimizing error in transient responses of parametric uncertain systems is considered, as motivated by design and control of micro-electromechanical actuators. A quadratic cost function is formulated as the sum of error components over a finite time span, with the optimization problem of minimizing the least upper bound of the quadratic function represented in terms of the eigenvalue of a certain matrix. This further allows for a linear fractional transformation form by which the nominal and uncertain parameters are separated into P and Δ matrices, analagous to standard LFT representations for robust controller design. The structured singular value, μΔ, is replaced with the spectral radius of the LFT-expressed matrix in the P-Δ configuration. A bulk piezoelectrical actuator-driven micro-robotic flexure joint is considered as a test case, where the stacking process of placing a PZT ceramic actuator on top of a micro-machined silicon flexure is subject to substantial processing error.
Keywords
control system synthesis; matrix algebra; microactuators; minimisation; piezoelectric actuators; quadratic programming; robust control; transient response; LFT representations; LFT-expressed matrix; PZT ceramic actuator; bulk piezoelectrical actuator-driven microrobotic flexure joint; error minimization; least upper bound minimization; linear fractional transformation form; microelectromechanical actuator design; micromachined silicon flexure; optimization problem; parametric uncertain systems; quadratic cost function; quadratic function; robust finite-duration transient response; stacking process; time-domain robust control design approach; Actuators; Eigenvalues and eigenfunctions; Joints; Optimization; Robustness; Silicon; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2011
Conference_Location
San Francisco, CA
ISSN
0743-1619
Print_ISBN
978-1-4577-0080-4
Type
conf
DOI
10.1109/ACC.2011.5991491
Filename
5991491
Link To Document