DocumentCode
2859244
Title
A lumped-modeling approach for TRAPATT diodes and external circuit analysis
Author
Mitchell, Robert
Volume
XVIII
fYear
1975
fDate
27426
Firstpage
98
Lastpage
99
Abstract
A generalized lumped-modeling technique for TRAPATT diode analysis and diode-external circuit characterization will be described, detailing critical parameters affecting efficient TRAPPAT operation.
Keywords
Aerospace electronics; Aircraft; Breakdown voltage; Circuit analysis; Circuit simulation; Electron traps; Plasma measurements; Semiconductor diodes; Silicon; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Type
conf
DOI
10.1109/ISSCC.1975.1155430
Filename
1155430
Link To Document