• DocumentCode
    2859929
  • Title

    Synthesis of circuits with low-cost concurrent error detection based on Bose-Lin codes

  • Author

    Das, Debaleena ; Touba, Nur A.

  • Author_Institution
    Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    1998
  • fDate
    26-30 Apr 1998
  • Firstpage
    309
  • Lastpage
    315
  • Abstract
    This paper presents a procedure for synthesizing multilevel circuits with concurrent error detection based on Bose-Lin codes (1985). Bose-Lin codes are an efficient solution for providing concurrent error detection as they are separable codes and have a fixed number of check bits, independent of the number of information bits. Furthermore, Bose-Lin code checkers have a simple structure as they are based on modulo operations. Procedures are described for synthesizing circuits in a way that their structure ensures that all single-point faults can only cause errors that are detected by a Bose-Lin code. This paper also presents an efficient scheme for concurrent error detection in sequential circuits. Both the state bits and the output bits are encoded with a Bose-Lin code and their checking is combined such that one checker suffices. Results indicate low area overhead. The cost of concurrent error detection is reduced significantly compared to other methods
  • Keywords
    combinational circuits; error detection codes; fault diagnosis; logic design; multivalued logic circuits; sequential circuits; Bose-Lin code checkers; check bits; error detection codes; low-cost concurrent error detection; modulo operations; multilevel circuit synthesis; self-checking combinational circuits; separable codes; sequential circuits; single-point faults; Circuit faults; Circuit synthesis; Circuit testing; Computer errors; Concurrent computing; Costs; Electrical fault detection; Fault detection; Inverters; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1998. Proceedings. 16th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-8436-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1998.670885
  • Filename
    670885