DocumentCode :
2861199
Title :
Microwave GaAs FETs: Reliability and reproducibility
Author :
Cohen, Emmanuel
Volume :
XIX
fYear :
1976
fDate :
18-20 Feb. 1976
Firstpage :
174
Lastpage :
174
Abstract :
Microwave gallium arsenide Schottky barrier field-effect transistors have great potential for use in both military and commercial systems. However, a number of problems remain to be solved before GaAs FETs can be considered systems ready. Methods of improving the reliability and reproducibility of these devices will be discussed.
Keywords :
Acoustical engineering; Bandwidth; Dynamic range; FETs; Gallium arsenide; Laboratories; Low-noise amplifiers; Microwave devices; Reproducibility of results; Schottky barriers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1976.1155550
Filename :
1155550
Link To Document :
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