Title :
Face recognition using binary image metrics
Author :
Takács, Barnabás ; Wechsler, Harry
Author_Institution :
WaveBand Corp., Torrance, CA, USA
Abstract :
We introduce a novel methodology applicable to face matching and fast screening of large facial databases. The proposed shape comparison method operates on edge maps and derives holistic similarity measures without the explicit need for point-to-point correspondence. While the use of edge images is important to introduce robustness to changes in illumination, the lack of point-to-point matching delivers speed and tolerance to local non-rigid distortions. In particular, we propose a face similarity measure derived as a variant of the Hausdorff distance by introducing the notion of a neighborhood function and associated penalties. Experimental results on a large set of face images demonstrate that our approach produces excellent recognition results even when less than 1% of the original grey scale face image information is stored in the face database (gallery). These results implicate that the process of face recognition may start at a much earlier stage of visual processing than it was earlier suggested
Keywords :
edge detection; face recognition; image matching; visual databases; Hausdorff distance; binary image metrics; edge images; edge maps; face database; face images; face matching; face recognition; face similarity measure; fast screening; grey scale face image information; holistic similarity measures; illumination; large facial databases; local non-rigid distortions; neighborhood function; point-to-point correspondence; point-to-point matching; recognition results; robustness; shape comparison method; visual processing; Distortion measurement; Face detection; Face recognition; Image databases; Image recognition; Image resolution; Lighting; Particle measurements; Robustness; Shape measurement;
Conference_Titel :
Automatic Face and Gesture Recognition, 1998. Proceedings. Third IEEE International Conference on
Conference_Location :
Nara
Print_ISBN :
0-8186-8344-9
DOI :
10.1109/AFGR.1998.670964