• DocumentCode
    2862020
  • Title

    Operation of a low-temperature memory element

  • Author

    Kraus, C.

  • Author_Institution
    IBM Corp., Kingston, NY, USA
  • Volume
    I
  • fYear
    1958
  • fDate
    20-21 Feb. 1958
  • Firstpage
    52
  • Lastpage
    54
  • Abstract
    Presents an abstract of the conference paper.
  • Keywords
    Circuits; Current measurement; Fabrication; Joining processes; Magnetic field measurement; Magnetic fields; Persistent currents; Superconductivity; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1958 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1958.1155603
  • Filename
    1155603
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2862020