• DocumentCode
    2862732
  • Title

    Formation of SiGe Nanorod arrays by combining nanoshpere lithography and Au-assisted chemical etching

  • Author

    Lai, C.H. ; Lee, Y.J. ; Yeh, P.H. ; Lee, S.W.

  • Author_Institution
    Inst. of Mater. Sci. & Eng., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    SiGe Nanorod (NR) arrays have been fabricated by combining nanosphere lithography and Au-assisted chemical etching. With controlling the etching rate and duration, the length of SiGe NRs can be tuned from 300 nm to 1 μnm. The morphology of SiGe NRs dramatically changed at different operating temperature. The results show a strong temperature dependence on fabrication of SiGe NRs. With TEM and SEM analysis, this work provides an effective approach to design the low-dimensional SiGe-based nanostructures for possible applications.
  • Keywords
    Ge-Si alloys; etching; nanolithography; nanorods; scanning electron microscopy; transmission electron microscopy; SEM analysis; TEM analysis; chemical etching; etching rate; nanorod arrays; nanoshpere lithography; nanostructures; Chemicals; Etching; Fabrication; Lithography; Nanostructures; Silicon; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991752
  • Filename
    5991752